The study of scan statistics and their applications to many different scientific and engineering problems have received considerable attention in the literature recently. In addition to challenging theoretical problems, the area of scan statis tics has also found exciting applications in diverse disciplines such as archaeol ogy, astronomy, epidemiology, geography, material science, molecular biology, reconnaissance, reliability and quality control, sociology, and telecommunica tion. This will be clearly evident when one goes through this volume. In this volume, we have brought together a collection of experts working in this area of research in order to review some of the developments that have taken place over the years and also to present their new works and point out some open problems. With this in mind, we selected authors for this volume with some having theoretical interests and others being primarily concerned with applications of scan statistics. Our sincere hope is that this volume will thus provide a comprehensive survey of all the developments in this area of research and hence will serve as a valuable source as well as reference for theoreticians and applied researchers. Graduate students interested in this area will find this volume to be particularly useful as it points out many open challenging problems that they could pursue. This volume will also be appropriate for teaching a graduate-level special course on this topic.

Autorentext
N. BALAKRISHNAN, PhD, is Professor of Mathematics and Statistics at McMaster University in Hamilton, Ontario, Canada.V. B. NEVZOROV, PhD, DS, is Professor of Probability and Statistics at St. Petersburg State University in St. Petersburg, Russia. Joseph Glaz has been appointed (effective July 1, 2011) as head of the Department of Statistics, University of Connecticut. He has co-authored several books. Glaz is the current editor-in-chief of the following Springer journal: Methodology and Computing in Applied Probability.
Honors and Awards include : election to the Connecticut Academy of Arts and Sciences (2011), elected fellow of the Institute of Mathematical Sciences (2009), AAUP Excellence in Research Award (2006), Abraham Wald Prize in Sequential Analysis (2006), elected fellow of the American Statistical Assoc. (2000), elected member of the International Statistical Institute (1999).
Most importantly, Joe Glaz has worked closely with Joseph Naus, the father of scan statistics, since this area of statistics was conceived around 1999.

Klappentext
This text presents advances in theory and methodology for this area of statistical research and application. The chapters contain broad coverage of theory and analytical and computational methods and techniques in four categories: introductory survey; discrete scan statistics; continuous scan statistics; and applications

Zusammenfassung
In this volume, we have brought together a collection of experts working in this area of research in order to review some of the developments that have taken place over the years and also to present their new works and point out some open problems.

Inhalt
I: Introduction and Preliminaries.- 1 Introduction to Scan Statistics.- II: Discrete Scan Statistics.- 2 Approximations for the Distribution and the Moments of Discrete Scan Statistics.- 3 Ratchet Scan and Disjoint Statistics.- 4 Scanning Multiple Sequences.- III: Continuous Scan Statistics.- 5 Approximations of the Distributions of Scan Statistics of Poisson Processes.- 6 An Approach to Computations Involving Spacings With Applications to the Scan Statistic.- 7 Using Moments to Approximate the Distribution of the Scan Statistic.- 8 Applying Ballot Problem Results to Compute Probabilities Required for a Generalization of the Scan Statistic.- 9 Scan Statistic and Multiple Scan Statistic.- 10 On Poisson Approximation for Continuous Multiple Scan Statistics in Two Dimensions.- IV: Applications.- 11 A Start-Up Demonstration Test Using a Simple Scan-Based Statistic.- 12 Applications of the Scan Statistic in DNA Sequence Analysis.- 13 On the Probability of Pattern Matching in Nonaligned DNA Sequences: A Finite Markov Chain Imbedding Approach.- 14 Spatial Scan Statistics: Models, Calculations, and Applications.