This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Thoroughly revised and updated from the popular 2005 edition, this textbook introduces both the theory and current practice of electron microscopy Contains expanded reference lists as a launch point into the specialist literature Requires only a first-year undergraduate knowledge of physics Written by a leading author who received the 2004 Distinguished Physical Scientist Award of the Microscopical Society of America Covers principles and techniques essential to materials science, the semiconductor industry, nanotechnology, and the biomedical and forensic sciences Includes supplementary material: sn.pub/extras

Autorentext

Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy. Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.

Zusammenfassung

Inhalt
An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Special Topics.- Appendix: Mathematical Derivations.