Light Scattering from Microstructures

The classical phenomenon of light scattering is one of the most studied t- ics in light-matter interaction and, even today, involves some controversial issues. A present focus of interest for many researchers is the possibility of obtaining information about microstructures, for example surface roughness, and the size, shape and optical properties of particles by means of a n- invasive technique such as the illumination of these objects with light. One of their main tasks is to extract the relevant information from a detailed study of the scattered radiation. This includes: measurement of the light intensity in di erent directions, analysis of its polarization, determination of its stat- tics,etc. Contributionstoresolvingthisproblemareimportantnotonlyfrom the point of view of increasing basic knowledge but also in their applications to several elds of industry and technology. Consider, for example, the pos- bility of distinguishing between di erent types of atmospheric contaminants, biological contaminants in our blood, the detection of microdefects in the manufacturing of semiconductors, magnetic discs and optical components, or the development of biological sensors. During the period September 11-13, 1998, we brought together a group of international experts on light scattering at the Summer School of Laredo at the University of Cantabria. In a series of one-hour lectures, they discussed currentaspectsoflightscatteringfrommicrostructureswithspecialemphasis on recent applications. The present book condenses those lectures into ve parts.

Up-to-date survey of microstructures, a field of great technological importance

Includes supplementary material: sn.pub/extras

Klappentext

With a tutorial approach, this book covers the most important aspects of the scattering of electromagnetic radiation from structures (isolated or on a substrate) whose size is comparable to the incident wavelength. Special emphasis is placed on the electromagnetic problem of microstructures located close to an interface by reviewing the most important numerical methods for calculating the scattered field. The polarization propagation and the statistics of scattered intensity in microstructured targets are also presented from a didactic point of view. The final part of the book is dedicated to the most significant applications in both basic and applied research: surface enhanced Raman scattering, monitoring and detection of surface contamination by particles, optical communications, particle sizing and others.

Inhalt
Light scattering by submicron spherical particles on semiconductor surfaces.- to Light Scattering from Microstructures.- Theory.- Heaviside Operational Calculus and Electromagnetic Image Theory.- Mathematical Methods for Data Inversion.- Mueller Matrices.- Scattering by Particles on Substrates. Numerical Methods.- Light Scattering from a Sphere Near a Plane Interface.- Electromagnetic Scattering by Cylindrical Objects on Generic Planar Substrates: Cylindrical-Wave Approach.- T-Matrix Method for Light Scattering from a Particle on or Near an Infinite Surface.- Scattering of Polarized Light.- Properties of a Polarized Light-Beam Multiply Scattered by a Rayleigh Medium.- Polarization and Depolarization of Light.- Statistics of the Scattered Light.- Polarisation Fluctuations in Light Scattered by Small Particles.- Intensity Statistics of the Light Scattered by Particles on Surfaces.- Applications.- Microstructures in Rough Metal Surfaces: Electromagnetic Mechanism in Surface-Enhanced Raman Spectroscopy.- Light Scattering by Particles and Defects on Surfaces: Semiconductor Wafer Inspection.- From Scattering to Waveguiding: Photonic Crystal Fibres.- The Angular Distribution of Light Emitted by Sonoluminescent Bubbles.- Light Scattering by Regular Particles on Flat Substrates.