This book describes the development of a new low-cost medium wavelength IR (MWIR) monolithic imager technology for high-speed uncooled industrial applications. It takes the baton on the latest technological advances in the field of vapor phase deposition (VPD) PbSe-based MWIR detection accomplished by the industrial partner NIT S.L., adding fundamental knowledge on the investigation of novel VLSI analog and mixed-signal design techniques at circuit and system levels for the development of the readout integrated device attached to the detector. In order to fulfill the operational requirements of VPD PbSe, this work proposes null inter-pixel crosstalk vision sensor architectures based on a digital-only focal plane array (FPA) of configurable pixel sensors. Each digital pixel sensor (DPS) cell is equipped with fast communication modules, self-biasing, offset cancellation, analog-to-digital converter (ADC) and fixed patternnoise (FPN) correction. In-pixel power consumption is minimized by the use of comprehensive MOSFET subthreshold operation.

Nominated as an outstanding PhD thesis by the Universitat Politècnica de Catalunya Reports on significant advances in solid-state IR imaging Describes a comprehensive, multidisciplinary research approach Lays the foundations of PbSe-based uncooled MWIR vision

Inhalt
Introduction.- Frame-Based Smart IR Imagers.- Frame-Free Compact-Pitch IR Imagers.- Pixel Test Chips in 0.35mm and 0.15mm CMOS Technologies.- Imager Test Chips in 2.5mm, 0.35mm and 0.15mm CMOS Technologies.- Conclusions.