This book deals with measurements and understanding, evaluating, and reporting uncertainties. Its goal is to present fundamental concepts rather than delve into professional expertise. It does not include formal axiomatisation, rigorous proofs, or demonstrations, typically found in specialised textbooks. It is not a monograph; it does not survey the entire field. It is not intended as a practitioner's manual, so readers will not find cookbook recipes for addressing problems. Instead, the book emphasises basic principles and concepts, logical justifications, and analytical and problem-solving skills development. It features many examples that gradually increase in complexity.

Fills a gap in the existing literature for metrologists Assesses Bayesian and frequentist uncertainty in measurement Provides a Mathematica notebook with symbolic and numerical computations Additional content is available on chapter level

Autorentext

Giovanni Mana trained as a theoretical physicist. After transitioning to metrology, he developed a broad range of interests in theoretical/mathematical and experimental/technical fields. They include metrology, precision measurements, mathematical physics, modelling, data analysis, Bayesian inference, neutron, X-ray, optical interferometry and diffractometry, Fourier optics, linear system, and control theory. He developed a split-crystal X-ray interferometer that operates over centimetre scans, which allowed precision measurements of the silicon lattice parameter and Avogadro constant. This way, he demonstrated that it is possible to count atoms and obtain the mass unit from the Planck constant, thus paving the way for the 2019 redefinition of the international system of units. The Italian Physical Society awarded him the Enrico Fermi Prize for these results.

Inhalt

Introduction.- Probability.- Direct Measurements.- Indirect Measurements.- Inductive Reasoning.