The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rstthere were two the ScanningTunnelingMicroscope,or STM,andtheAtomicForceMic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when itwasplacednearthesample.These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM.TheMFMwillimageasinglemagneticbitwithfeaturesassmallas10nm. WiththeEFMonecanmonitorthechargeofasingleelectron.Prof.PaulHansma atSantaBarbaraopenedthedoorevenwiderwhenhewasabletoimagebiological objects in aqueous environments. At this point the sluice gates were opened and amultitudeofdifferentinstrumentsappeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM canrecord3Dimage andmovies, featuresthatarenotavailable withthescanning probes. TheNearFieldOpticalMicroscopeorNSOMisalsomemberofthisfamily.At thistimetheinstrumentsuffersfromtwolimitations;1)mostoftheopticalenergy is lost as it traverses the cut-off region of the tapered ?ber and 2) the resolution is insuf?cient for many purposes. We are con?dent that NSOM s with a reasonable opticalthroughputandaresolutionof10nmwillsoonappear.TheSNOMwillthen enterthemainstreamofscanningprobes. VI Foreword In the Harmonic Force Microscope or HFM, the cantilever is driven at the resonantfrequencywiththeamplitudeadjustedsothatthetipimpactsthesampleon each cycle. Theforcesbetween tipandsample generate multiple harmonics inthe motionofthecantilever.Thestrengthoftheseharmonicscanbeusedtocharacterize thephysicalpropertiesofthesurface.

First book summarizing the state of the art of this technique Real industrial applications included Includes supplementary material: sn.pub/extras

Autorentext
Harald Fuchs, Jahrgang 1954 und Vater von drei Kindern, lebt in Pforzheim. Er arbeitete viele Jahre selbstständig in der Werbebranche, bis er sich 2004 umorientierte und unter anderem eine Ausbildung als Elektrobiologe absolvierte. 2008 begann er, sein Wissen auf eigenen Vorträgen und Seminaren an die Menschen weiterzugeben. Technologische sowie gesellschaftliche Entwicklungen und Veränderungen stehen dabei stets im Mittelpunkt seiner Betrachtungen.

Klappentext

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Inhalt
Scanning Probe Lithography for Chemical, Biological and Engineering Applications.- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM).- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography.- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography.- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM).- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection.- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices.- Applications of Heated Atomic Force Microscope Cantilevers.