This new volume in the Frontiers in Electronic Testing book series is devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today's state-of-the-art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey. The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. The book is intended for advanced undergraduate and graduate students, and professionals in the electronic testing realm.

First book that reviews a comprehensive set of advanced electronic testing topics Hot" topics of current interest to test technology community has been selected Authors are key contributors in the corresponding topics The book has a practical, industrial orientation that makes it valuable both to the academic/research community and the industry/practitioning industry

Inhalt
Defect-Orinted Testing.- Failure Mechanisms and Testing in Nanometer Technologies.- Silicon Debug.- Delay Testing.- High-Speed Digital Test Interfaces.- DFT_Oriented,Low-Cost Testers.- Embedded Cores and System-on-Chip Testing.- Embedded MemoryTesting.- Mixed-Signal Testing and DfT.- RF Testing.- Loaded Board Testing.