Metrology is the science of measurements. It is traceable to measurement standards, thus to the concept of measurement accuracy, which is used in all natural and technical sciences, as well as in some fields of social sciences and liberal arts.
The key problem is one of obtaining knowledge of the physical reality, which is observed through a prism of an assemblage of quantity properties describing the objectively-real world. One of the fundamental tasks of metrology is the development of theoretical and methodological aspects of the procedure of getting an accurate knowledge relating to objects and processes of the surrounding world.
Due to the rapid development of information technologies and intelligent measurement systems and measuring instruments, as well as to the growing usage of mathematical methods in social and biological sciences, this monograph is dedicated to convey the fundamental theory.

Autorentext

Valery A. Slaev, Mendeleyev Research Institute for Metrology, Saint Petersburg, Russia; Anna G. Chunovkina, D.I. Mendeleyev Research Institute for Metrology (VNIIM), Saint Petersburg, Russia; Leonid A. Mironovsky, Saint Petersburg State University of Aerospace Instrumentation, Russia.

Zusammenfassung

The De Gruyter Studies in Mathematical Physics are devoted to the publication of monographs and high-level texts in mathematical physics. They cover topics and methods in fields of current interest, with an emphasis on didactical presentation. The series will enable readers to understand, apply and develop further, with sufficient rigor, mathematical methods to given problems in physics. For this reason, works with a few authors are preferred over edited volumes. The works in this series are aimed at advanced students and researchers in mathematical and theoretical physics. They can also serve as secondary reading for lectures and seminars at advanced levels.

Inhalt

Foreword
Introduction
1 International measurement system
2 Systems of reproducing physical quantities units and transferring their sizes (RUTS)
3 Potential measurement accuracy
4 Algorithms for evaluating the result of three measurements
5 Metrological traceability of measurement results
6 Validation of software used in metrology
Conclusion
Appendix
Bibliography
Index