Ion Formation from Organic Solids (IFOS III)

The 3rd International Conference on Ion Formation from Organic Solids (IFOS III) was held at the University of Munster, September 16-18, 1985. The conference was attended by 60 invited scientists from all over the world. Of the 43 papers which were presented, 40 are included in these proceedings. The aim of IFOS III was to promote the exchange of results and new ideas between scientists actively working in the field of mass spectrometry of involatile materials. Various aspects of the ion formation process - realization and optimization, theoretical understanding and analytical application -were treated, as well as instrumental developments. Some emphasis was placed on recent developments in time-of-flight and Fourier transform ion cyclotron resonance mass spectrometry, and its impact on the mass spectrometry of involatile materials. The most important goal of the conference was to combine facets of the understanding of the most complex ion formation processes with the many different aspects of its analytical application. The participants came from a wide variety of different fields, including pure and applied physics and chemistry, medicine, pharmacy, and space research. Finally, on behalf of all the conference participants, I would like to thank Dr. W. Sichtermann and :\1iss I. Bekemeier for the perfect preparation and technical organization of the conference. The next conference in this series, IFOS IV, is planned for the autumn of 1987, in Munster.

Inhalt

I 252Cf-Plasma Desorption.- Use of Polymer Surfaces for Molecular Ion Adsorption and Desorption.- Electronic Sputtering of Biomolecules.- On the Charge-State Dependence of Secondary Ion Emission from Phenylalanine.- Particle Desorption from Non-Metallic Surfaces by High Energy Heavy Ions.- 252Cf-PDMS: Multiplicity of Desorbed Ions and Correlation Effects.- II Secondary Ion Mass Spectrometry (SIMS).- Surface Organic Reactions Induced by Ion Bombardment.- Ion Bombardment MS: A Sensitive Probe of Chemical Reactions Occurring at the Surface of Organic Solids.- Ion-Neutral Correlations Following Metastable Decay.- Metastable Ion Studies with a 252Cf Time-of-Flight Mass Spectrometer.- Increasing Secondary Ion Yields: Derivatization/SIMS.- Aspects and Applications of Derivatization/SIMS.- Influence of the Target Preparation on the SI-Emission of Organic Molecules.- Secondary Ion Formation Processes in Amino Acid-Metal Adsorption Systems.- Analytical Applications of High-Performance TOF-SIMS.- TOF-SIMS of Polymers in the High Mass Range.- The Application of Time-of-Flight Secondary Ion Mass Spectrometry in the Characterization of Apolipoprotein Mutants.- III Liquid SIMS Including FAB.- Sputtering Yields from Liquid Organic Matrices.- Sputtering from Liquid and Solid Organic Matrices.- Secondary Ion Emission from Glycerol and Silver Supported Organic Molecules.- Temperature Effects in Particle Bombardment Mass Spectrometry of Methanol.- Internal Energy Distribution of Ions Emitted in Secondary Ion Mass Spectrometry.- Fast Atom Bombardment of Peptides Above 5000 Daltons.- Amino Acid Sequencing of Peptide Mixture: Structural Analysis of Human Hemoglobin Variants (Digit Printing Method).- Oligonucleotide Sputtering from Liquid Matrices.- Some Experiments on the Production of Ions in Soft Ionisation Mass Spectrometry.- Decompositions Occurring Remote from the Charge Site: A New Class of Fragmentation of FAB-Desorbed Ions.- IV Laser-Induced Ion Formation.- Laser and Plasma Desorption: Matrices and Metastables in Time-of-Flight Mass Spectrometry.- Evidence for Simultaneous Generation of Ion Pairs in Laser Mass Spectrometry.- The Influence of the Substrate on Ultraviolet Laser Desorption Mass Spectrometry of Biomolecules.- On Different Desorption Modes in LDMS.- V Other Ion Formation Processes.- "Spontaneous" Desorption of Negative Ions from Organic Solids and Films of Ice at Low Temperature.- Electric Pulse-Induced Desorption Compared to Other Techniques - Mechanism, Mass Spectra, and Applications.- VI Instrumentation.- A New Dual-MS Technique Combining Negative Ion Formation by Plasma Desorption with EI-like Positive Ion Formation by In-Beam Desorption.- The Chemical Ionization/Particle-Induced Ion Source.- Design of Modern Time-of-Flight Mass Spectrometers.- Design of an Organic SIMS Instrument with Separate Triple Stage Quadrupole (TSQ) and Time-of-Flight (TOF) Spectrometers.- High-Resolution TOF Secondary Ion Mass Spectrometer.- VII Fourier Transform Ion Cyclotron Resonance.- Laser Desorption Fourier Transform Mass Spectrometry: Mechanisms of Desorption and Analytical Applications.- Desorption Ionization and Fourier Transform Mass Spectrometry for the Analysis of Large Biomolecules.- Application of Secondary Ion Mass Spectrometry Combined with Fourier Transform Ion Cyclotron Resonance.- Index of Contributors.