Embedded systems are assuming key control functions in everyday life. Systemic failure in the energy supply or the transport sector could lead to fatal consequences. Users place great reliance on the error-free function of such systems. Guaranteeing the functional capability of digital circuits is the goal of testing and this aim must be achieved at low cost, since every chip has to be tested separately after production.

Autorentext

Stephan Eggersglüß, Görschwin Fey, Ilia Polian