Handbook of Measurement and Characterization of Metamaterials

The exhaustive research work being carried out in the field of metamaterials has provided promising devices, components, and subsystems that could potentially surpass the limitations of current technology in many fields like electromagnetic, optics, acoustics etc. The immense technological potential of metamaterials has drawn attention of many researchers worldwide working in microwave (MW), millimeter wave (mmW), infrared (IR), optical frequency regimes, and acoustics for developing novel components and subsystems for various applications. The characterization of metamaterials is an essential pre-requisite for its efficient usage in any of the applications. These include electromagnetic (EM) material characterization (in MW, mmW, and THz frequency regimes), optical characterization, and acoustic characterization depending on the type of materials and applications. It is observed that the analytical and field averaging methods based on simulation tools often lead to erroneous results, while retrieving the constitutive parameters of metamaterials. Hence experimental techniques are essentially required for accurate characterization of metamaterials as the reliability of hardware realization of metamaterial based sub-systems/ components depend extensively on the intrinsic properties.
In view of this, different methods and techniques for characterization of metamaterials are discussed in detail in this book, which will benefit researchers, engineers, scientists, students, and academicians working in the fascinating world of metamaterials. This volume from the handbook series covers almost all aspects of metamaterial science and technology, starting from theoretical modeling, fabrication techniques, measurements procedures till hardware realization. The editors have been chosen from the pioneers and leaders in the field of nanoscience, nano-fabrication technologies for metamaterial science and technology.

Title is also available as part of a set: Handbook of Measurement and Characterization of Metamaterials (978-981-19-0720-3)

Auteur
Dr Raveendranath U. Nair is a Senior Principal Scientist and Head at Centre for Electromagnetics (CEM) of CSIR-National Aerospace Laboratories (CSIR-NAL), Bangalore, India. He received his M.Sc in Physics (1989) and Ph.D in Microwave Electronics (1997) degrees from the School of Pure and Applied Physics, Mahatma Gandhi University, Kerala, India. From November 1997 to July 1999, he joined as a lecturer in the Department of Electronics, CUSAT. During this period, he participated as a co-researcher in activities related to international collaborative project for Ground Penetrating Radar (GPR) between CUSAT and International Research Centre for Telecommunications and Radar (IRCTR), TU Delfts, The Netherlands. Dr R U Nair joined CEM, CSIR-NAL in 1999. Dr R U Nair received the CSIR-NAL Excellence in Research Award (2007-2008) for his contributions to the EM design of variable thickness airborne radomes. His research interests include electromagnetic design and performance analysis of radomes, radar cross section, frequency selective surfaces (for Radomes and RAS), EM material characterization, complex media electromagnetics and microwave measurements. He is a life member of Aeronautical Society of India (AeSI), member of ISAMPE and member of IEEE. Dr R U Nair is also a Professor of the Academy of Scientific and Innovative Research (AcSIR), New Delhi. Dr R U Nair has authored/co-authored over 260 research publications including peer reviewed journal papers, symposium papers and technical reports. He has co-authored a chapter in a book Sensors Update published by Wiley-VCH, Germany (2000). The electromagnetic (EM) material characterization techniques developed for his doctoral work were included in the section Perturbation Theory in RF and Microwave Encyclopaedia (Vol. 4) published by John-Wiley & Sons, USA (2005). Dr Nair also holds post of Professor in Academy of Scientific and Innovative Research (AcSIR).

Dr. Biju Kumar Sreedharan Nair is currently working as Director, HW group, Professional Systems Business unit R&D at Philips Lighting Head Quarters in The Netherlands. He has received M.Sc in Physics from Kerala University, India in 1997 and his PhD in Microwave Electronics from the Department of Electronics at Cochin University of Science & Technology (CUSAT), India, in 2002. He subsequently did post-doctoral research at the University of Huddersfield, UK and later at the International Research Center for Telecommunications and Radar (IRCTR), TU Delft, the Netherlands. Dr Nair has been invited for training in the International Center for Theoretical Physics (ICTP), Italy and has been awarded the Young Scientist Award by Government of India as part of which he has attended the Nobel Laureates meeting in Lindau, Germany. Dr Nair joined Philips Research as a Senior Scientist in 2005, Philips Lighting as Hardware Architect responsible for development and pre-development of products in 2010 and assumed the position of Director, R&D Hardware group in a Philips Lighting business in 2017. His research topics include properties of materials at microwave frequencies; ground penetrating radar, non-invasive material characterization, Piezo-electric materials, antennas and propagation models. He has authored more than 40 publications in peer reviewed journals, symposia & technical reports and has more than 10 patents on different topics.

Contenu
Chapter 1: Introduction.- Survey of the methods.-Salient features and importance of EM characterization towards H/w realization.- Chapter 2: Challenges in EM Characterization of metamaterial.- Chapter 3: Waveguide measurement methods.- Chapter 4: Free space measurement methods.- Chapter 5: Cavity resonator method.- Chapter 6: Stripline based methods.- Chapter 7: Characterization of IR metamaterials.- Chapter 8: Characterization of Optical metamaterials.- Chapter 9: Spectroscopy systems for characterization of Metasurfaces.- Chapter 10: Nearfield imaging towards metamaterial based application.- Chapter 11: EM characterization of sub-millimeter wave and terahertz metamaterials.- Chapter 12: Extraction of constitutive parameters of metamaterials based on simulation.- Chapter 13: EM characterization methods for anisotropic 3D metamaterials on curved surfaces.