In February of 1990, the balloting process for the IEEE proposed standard P1149.1 was completed creating IEEE Std 1149.1-1990. Later that summer, in record time, the standard won ratification as an ANSI standard as well. This completed over six years of intensive cooperative effort by a diverse group of people who share a vision on solving some of the severe testing problems that exist now and are steadily getting worse. Early in this process, someone asked me if 1 thought that the P1l49.l effort would ever bear fruit. 1 responded somewhat glibly that "it was anyone's guess". Well, it wasn't anyone's guess, but rather the faith of a few individuals in the proposition that many testing problems could be solved if a multifaceted industry could agree on a standard for all to follow. Four of these individuals stand out; they are Harry Bleeker, Colin Maunder, Rodham Tulloss, and Lee Whetsel. In that I am convinced that the 1149.1 standard is the most significant testing development in the last 20 years, I personally feel a debt of gratitude to them and all the people who labored on the various Working Groups in its creation.

Klappentext

The fundamental 1149.1 standard is now over 13 years old and has a large infrastructure of support in the electronics industry. Today, a majority of custom ICs and Programmable Logic Devices have 1149.1 implementations. The Boundary-Scan Handbook, Third Edition updates the information about 1149.1, which has been revised as recently as 2001. It contains a description of the 1149.4 "Analog Boundary-Scan" standard, and gives a tutorial on analog testing technology. It then introduces the recently released IEEE 1149.6 "Advanced I/O" standard, which extends Boundary-Scan to deal with AC-coupled differential signaling now becoming common in higher performance system. Finally, since a board test system provides a suitable environment for programming non-volatile Programmable Logic Devices, the IEEE 1532 standard is described which extends the 1149.1 access protocol into the device programming domain. This forms an essential tools for testing boards and systems of the future.

Inhalt
1 Boundary-Scan Basics and Vocabulary.- 1.1 Digital Test Before Boundary-Scan.- 1.2 The Philosophy of 1149.1.- 1.3 Basic Architecture.- 1.4 Non-Invasive Operational Modes.- 1.5 Pin-Permission Operational Modes.- 1.6 Extensibility.- 1.7 Subordination of IEEE 1149.1.- 1.8 Costs and Benefits.- 1.9 Other Testability Standards.- 2 Boundary-Scan Description Language (BSDL).- 2.1 The Scope of BSDL.- 2.2 Structure of BSDL.- 2.3 Entity Descriptions.- 2.4 Some advanced BSDL Topics.- 2.5 BSDL Description of 74BCT8374.- 2.6 Packages and Package Bodies.- 2.7 Writing BSDL.- 2.8 Summary.- 3 Boundary-Scan Testing.- 3.1 Basic Boundary-Scan Testing.- 3.2 Testing with Boundary-Scan Chains.- 3.3 Porting Boundary-Scan Tests.- 3.4 Boundary-Scan Test Coverage.- 3.5 Summary.- 4 Advanced Boundary-Scan Topics.- 4.1 DC Parametric IC Tests.- 4.2 Sample Mode Tests.- 4.3 Concurrent Monitoring.- 4.4 Non-Scan IC Testing.- 4.5 Non-Digital Device Testing.- 4.6 Mixed Digital/Analog Testing.- 4.7 Multi-Chip Module Testing.- 4.8 Firmware Development Support.- 4.9 In-System Configuration.- 4.10 Flash Programming.- 4.11 Hardware Fault Insertion.- 4.12 Power Pin Testing.- 5 Design for Boundary-Scan Test.- 5.1 Integrated Circuit Level DFT.- 5.2 Board-Level DFT.- 5.3 System-Level DFT.- 5.4 Summary.- 6 Analog Measurement Basics.- 6.1 Analog In-Circuit Testing.- 6.2 Limited Access Testing.- 7 IEEE 1149.4: Analog Boundary-Scan.- 7.1 1149.4 Vocabulary and Basics.- 7.2 General Architecture of an 1149.4 IC.- 7.3 The 1149.4 Instruction Set.- 7.4 Other Provisions of 1149.4.- 7.5 Design for 1149.4 Testability.- 7.6 Summary.- 8 IEEE 1149.6: Testing Advanced I/O.- 8.1 The Advanced I/O Problem.- 8.2 1149.6 Vocabulary and Basics.- 8.3 Test Facilities for Ac Pins.- 8.4 The Defect Model for 1149.6.- 8.5 The 1149.6 Test Receiver.- 8.6 BSDL Extensions for 1149.6.- 8.7 Design for 1149.6 Testability.- 8.8 Summary.- 9 IEEE 1532: In-System Configuration.- 9.1 IEEE 1532 Vocabulary and Basics.- 9.2 Programming Features of IEEE 1532.- 9.3 Design for IEEE 1532 Programmability.- 9.4 Epilog: What Next for 1149.1,1149.4,1149.6 and 1532?.- A. BSDL Syntax Specifications.- A.l Conventions.- A.2 Lexical elements of BSDL.- A.3 Notes on syntax definition.- A.4 BSDL Syntax.- A.5 User Package Syntax.- A.6 1149.6 Extention Attribute Syntax.