The understanding of hydrogen/lithium insertion phenomena is of great importance for the development of the next generation of functional electrochemical devices such as rechargeable batteries, electrochromic devices, and fuel cells. This volume introduces a variety of viable electrochemical methods to identify reaction mechanisms and evaluate relevant kinetic properties of insertion electrodes. The authors also outline various ways to analyze anomalous behaviour of hydrogen/lithium transport through insertion electrodes.

The first monograph on the electrochemistry of insertion electrodes used for rechargeable batteries, and electrical displays The authors contributed significantly to the understanding of these phenomena Consistent style of presentation Includes supplementary material: sn.pub/extras

Autorentext

Su-Il Pyun is Professor Emeritus at the Korea Advanced Institute of Science and Technology (KAIST) and Distinguished Professor at Jeju National University, Korea. Among other prizes, he was awarded the Prize of outstanding Professor for this great academic achievement in electrochemistry and materials science by KAIST two times 1996 and 1999. The life-long experience and enthusiasm of him as senior author and his co-authors form the solid basis for this monograph. Heon-Cheol Shin is a professor of materials science and engineering at Pusan National University in Busan, Korea, Dr. Jong-Won Lee is Senior Research Scientist at the Korea Institute of Energy Research (KIER), Korea, and Dr. Joo-Young Go is an engineer at SB LiMotive in Giheung, Korea.

Inhalt

Electrochemical Methods.- Hydrogen Absorption into and Subsequent Diffusion through Hydride-Forming Metals.- Hydrogen Transport under Impermeable Boundary Conditions.- Hydrogen Trapping inside Metals and Metal Oxides.- Generation of Internal Stress during Hydrogen and Lithium Transport.- Abnormal Behaviors in Hydrogen Transport: Importance of Interfacial Reactions.- Effect of Cell-impedance on Lithium Transport.- Lithium Transport through Electrode with Irregular/Partially-Inactive Interfaces.