This book provides a comprehensive and systematic introduction to optoelectronic imaging techniques. Starting from the basis of photoelectric detection technology, it thoroughly discusses the basic knowledge of radiation measurement and light metrics, the basic principles of semiconductors, and the basic physical effects and characteristic parameters of photoelectric detection devices. It further introduces the types and characteristics of light sources commonly used in photoelectric detection. This lays a solid foundation for readers to learn the single photon detector, single photon imaging technology, and spectral imaging technology. This book also details the working principle, classification characteristics, and performance evaluation method of single-photon detectors, as well as the applications in low-light detection and quantum communication. Spectral imaging technology and two-dimensional imaging technology are also explained in terms of basic principles, system classification and characteristics.

It also focuses on the practical applications of photoelectric detection technology in various fields, including remote sensing, atomic absorption spectroscopy analysis, mechanical quantity detection, etc., showing the wide application and great potential of photoelectric detection technology through specific cases. The frontiers and development trends of optoelectronic imaging technology are discussed, revealing the future development direction and challenges in this field for the readers.

Autorentext

Sichao Du received his B.Sc. degree in Materials Physics from Northwestern Polytechnical University in 2005, Xi’an, China. Then, he received his M.Phil. and Ph.D. degrees in Optoelectronics Devices and Materials from Australian National University and University of Sydney in 2009 and 2014, respectively, Australia. In 2016, he joined the School of Information Science and Electronic Engineering of Zhejiang University as an overseas outstanding Postdoctoral Research Fellow. He is currently Associate Professor and working as Principal Investigator at the School of Information and Electrical Engineering of Zhejiang University City College. He established a Laboratory of Single-Photon Detection and Imaging Techniques at Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment.

Wen-Yan Yin (M’99- SM’01-F’13) received the M.S. degree in electromagnetic fields and microwave techniques from Xidian University, Xi’an, China, in 1989, and the Ph.D. degree in electrical engineering from Xi’an Jiao Tong University, Xi’an, China, in 1994. From April 2005 to Dec.2008, he was a Professor in the School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University (SJTU), Shanghai, China. Since January 2009, he has been with the Zhejiang University (ZJU), Hangzhou, China, as a “Qiu Shi” Distinguished Professor. He is now the director of the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), College of Information Science and Electronic Engineering (ISEE) of ZJU.

Inhalt

Basis of Photoelectric Detection Technology.- Common Light Source in Photoelectric Detection.- Single-Photon Detector.- Single-photon Imaging Technology.- Spectral Imaging Technology.- Two-dimensional Imaging technology.- Application of Photoelectric Detection Technology.