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Optical Metrology

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Proceedings of the NATO Advanced Study Institute held in Viana do Castelo, Portugal, July 16-27, 1984Optical Metrology is a rapidl... Weiterlesen
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Beschreibung

Proceedings of the NATO Advanced Study Institute held in Viana do Castelo, Portugal, July 16-27, 1984

Optical Metrology is a rapidly expanding field i'n both its scientific foundations and technological developments, being of major concern to measurements, quality control, non-destructive tes ting and in fundamental research. In order to define the state-of-the-art, and to evaluate pre sent accomplishments, whilst giving an appraisal of how each of the particular topics will evolve the Optical Metrology-anAdvancedStudy Institute was organized with a concourse of the world's acknowledged experts. Thus, the Institute provided a forum for tutorial reviews blended with topics of current research in the form of a progressive and comprehensive presentation of recent promising developments, lea ding techniques and instrumentation in incoherent and coherent optics for Metrology, Sensing and Control in Science, Industry and Biomedici ne. Optical Metrology is a very broad field which is highly inter disciplinary in its applications, and in its scientific and technolo gical background. It is related to such diverse disciplines as physi cal and chemical sciences, engineering, electronics, computer scien ces, biological sciences and theoretical sciences, such as statistics. Although there was an emphasis on photomechanics and industri al applications, a marked diversity was reflected in the different background and interests of the participants. The vitality and viabi lity of the discipline was enhanced not only by the encouraging number of young scientists and industrialists participating and authoring, but also by the remarkably promising prospects found in x the practical applications supported by advanced electronic hybridi zation.

Inhalt
Foundations.- Optical Metrology - Some Personal Reflections.- Beam Deflection and Image Forming System.- Measurement of Surface Form by Laser Profilometry.- Three-Dimensional Inspection of Large Objects.- Laser Dimensional Metrology.- Distance Sensing Via Spectrographs Coding.- Interferometry, Velocimetry and Photon Correlation.- Some Recent Developments in Laser Interferometry.- Laser Heterodyne Probes.- Scanning Differential Phase Contrast Optical Microscope Application to Surface Studies and Micro Metrology.- Laser Velocimetry.- Velocity Measurements in a Rotating Tank Using and LDV System.- Sizing of Microscopic Particles by Photon Correlation.- Image Processing Techniques.- Optical Fourier Transform Construction.- Optical Metrology of Fish Scales.- Hybrid Coherent Optical and Electronic Filtering.- Hybrid Coherent Optical and Electronical Object Recognition.- Dynamical Digital Memory for Holography, Moiré and E.S.P.I.- Automation in Manufacturing Intelligent Sensing.- Moire Methods.- Moiré Interferometry and Its Developments in Strain Analysis.- Measurements of Fracture Toughness and Integrity by Moiré Interferometry.- Phase-Measuring Moiré Topography.- Holographic Metrology.- The Holo-Diagram, Sandwich-Holography and Light-in-Flight Recording.- Quantitative Interpretation of Time-Average Holograms in Vibration Analysis.- Matrix Methods in Hologram Interferometry and Speckle Metrology.- Optical Metrology and Computer Tomography for Measurement of Temperature and Density.- Unification of FEM with Laser Experimentation.- Moiée Evaluation with Fringe Patterns of Interferograms, Holograms, Moirégrams and Specklegrams.- Electronic Processing for Holographic Interferometry.- Holography in Medicine and Biology - State of the Art and The Problem of Increasing Militarization.- Holographic Cinematography with the Help of a Pulse Yag Laser.- Phase Conjugation Metrology.- Holographic Metrology and Nondestructive Testing - Past and Future.- Speckle Methods.- Speckle Metrology.- Recent Developments on Speckle Pattern Correlation by Photographical Means.- Heterodyne Speckle Photogrammetry.- Measuring Microvibrations by Heterodyne Speckle Interferometry.- Electronic Speckle Pattern Interferometry.- Convective Mass Transfer Coefficient Measurement by Holographic and Electronic Speckle Pattern Interferometry.- Improvements on Electronic Speckle Pattern Interferometry.- Speckle Reduction in Four-Wave Mixing Imaging with a Bi12 Si 020 Crystal.- Optical Fibre Metrology.- Single-Mode Fiber Optical Sensors.- Design of a Fiber Optic Hydrophone.- Fiber Optic Sensors as Dosimeters for Ionizing Radiation.- Picosecond Pulse Metrology.- Picosecond Metrology.- Optical SOLITONS: a short presentation.- Photoelasticity.- Photoelasticity.- Non-Destructive 3D Photoelasticity.- Further Topics.- Optical Metrology at Loughborough University.- Closing Remarks.- Conclusions and Future Events.- Remark: Holography and Relativity.

Produktinformationen

Titel: Optical Metrology
Untertitel: Coherent and Incoherent Optics for Metrology, Sensing and Control in Science, Industry and Biomedicine
Editor:
EAN: 9789401081153
ISBN: 9401081158
Format: Kartonierter Einband
Herausgeber: Springer Netherlands
Anzahl Seiten: 816
Gewicht: 1212g
Größe: H235mm x B155mm x T43mm
Jahr: 2011
Auflage: Softcover reprint of the original 1st ed. 1987

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