MEMS and Nanotechnology, Volume 6: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics represents one of seven volumes of technical papers presented at the Society for Experimental Mechanics SEM 12th International Congress & Exposition on Experimental and Applied Mechanics, held at Costa Mesa, California, June 11-14, 2012. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Challenges in Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials, Imaging Methods for Novel Materials and Challenging Applications, Experimental and Applied Mechanics, Mechanics of Biological Systems and Materials and, Composite Materials and Joining Technologies for Composites.

This is the sixth volume of the Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics

Klappentext
MEMS and Nanotechnology, Volume 6: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, the sixth volume of seven from the Conference, brings together 23 contributions to this important area of research and engineering. The collection presents early findings and case studies on fundamental and applied aspects of Experimental and Applied Mechanics, including papers on: Devices & FabricationMeasurement Challenges in Single Molecule/Single Atom Mechanical TestingNanoindentationSize Effects in MetalsOptical MethodsReliability, Residual Stress & Tribology

Inhalt
From the Contents: Silicon Carbide High Temperature MEMS Capacitive Strain Sensor.- Characterizing External Resistive, Inductive and Capacitive Loads for Micro-switches.- KEYNOTE: Principles Involved in Interpreting Single-Molecule Force Measurement of Biomolecules.- KEYNOTE: Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-atom Chain Using Photon-momentum-based Force Calibration.- A Precision Force Microscope for Biophysics.- DNA Molecular Recognition Using AFM Nanometrology.- Hydrodynamic Force Compensation for Single-molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy.- New Insight into Pile-Up in Thin Film Indentation.