Reliability Improvement Technology for Power Converters

This book describes how to design circuits in power electronics systems using a reliability approach in three-level topologies, which have many advantages in terms of the current total harmonic distortion and efficiency. Such converter types are increasingly used in large power applications and photovoltaics (PV), therefore research on improvements in the reliability of such systems using multi-level topologies has become important. Four studies for reliability improvement are contained in this book: an open-circuited switch fault detection scheme, tolerance control for an open-circuited switch fault, neutral-point voltage ripple reduction, and leakage current reduction. This book treats not only the topology, but also the fault tolerance and the reduction of the ripples and leakage. This book is aimed at advanced students of electrical engineering and power electronics specialists.

Presents a new modulation technique of reliability improvement schemes for a three-level converter Offers valuable information for postgraduate students in electrical engineering, as well as power electronics specialists Shows how to design circuits in power electronics systems using multi-level topologies Includes supplementary material: sn.pub/extras

Autorentext
Kyo-Beum Lee received the B.S. and M.S. degrees in electrical and electronic engineering from the Ajou University, Korea, in 1997 and 1999, respectively. He received the Ph.D. degree in electrical engineering from the Korea University, Korea in 2003. From 2003 to 2006, he was with the Institute of Energy Technology, Aalborg University, Aalborg, Denmark. From 2006 to 2007, he was with the Division of Electronics and Information Engineering, Chonbuk National University, Jeonju, Korea. In 2007 he joined the School of Electrical and Computer Engineering, Ajou University, Suwon, Korea. He is an associated editor of the IEEE Transactions on Power Electronics, the Journal of Power Electronics, and the Journal of Electrical Engineering & Technology. His research interests include electric machine drives, renewable power generations, and electric vehicle applications. June-Seok Lee received the B.S., M.S., and Ph.D. degrees in electrical and computer engineering from Ajou University, Suwon, Korea, in 2011, 2013, and 2015, respectively. Since 2015, he has been with the Korea Railroad Research Institute, Uiwang, Korea. His research interests include grid-connected systems, multilevel inverters and reliability.

Klappentext
This book describes how to design circuits in power electronics systems using a reliability approach in three-level topologies, which have many advantages in terms of the current total harmonic distortion and efficiency. Such converter types are increasingly used in large power applications and photovoltaics (PV), therefore research on improvements in the reliability of such systems using multi-level topologies has become important. Four studies for reliability improvement are contained in this book: an open-circuited switch fault detection scheme, tolerance control for an open-circuited switch fault, neutral-point voltage ripple reduction, and leakage current reduction. This book treats not only the topology, but also the fault tolerance and the reduction of the ripples and leakage. This book is aimed at advanced students of electrical engineering and power electronics specialists.

Inhalt
Preface.- 1 Three-level Converter Overview.- 2 Open-circuit Fault Detection Methods for Three-level Converters.- 3 Three-level Converter Tolerant Control for Switch Fault.- 4 Neutral-point Voltage Reduction.- 5 Leakage Current Reduction.- 6 Switch Fault Diagnosis and Tolerant Control in Cascaded H-bridge Multilevel Inverters. <p