Written by three leading experts in the field, this textbook describes and explains all aspects of scanning probe microscopy, i.e. scanning tunneling microscopy, scanning force microscopy, magnetic force microscopy, and related imaging techniques with atomic-scale resolution. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Novel applications and the latest important results are also presented. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Ideal text for newcomers to this exciting field Written by three leading experts Comprehensive coverage of all scanning probe techniques Includes supplementary material: sn.pub/extras

Inhalt
1 Introduction to Scanning Probe Microscopy.- 2 Introduction to Scanning Tunneling Microscopy.- 3 Force Microscopy.- 4 MFM and Related Techniques.- 5 Other Members of the SPM Family.- 6 Artifacts in SPM.- 7 Prospects for SPM.- References.