This book provides a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

Provides a state of the art report of the technique of ellipsometry Presents recent developments in ellipsometric real-time/in-situ monitoring techniques Is oriented towards the high technological interest in the characterization of functional organic films and surfaces Includes the collection of optical constants Written by leading scientists Includes supplementary material: sn.pub/extras

Inhalt
Biomolecules at surfaces.- Smart polymer surfaces and films.- Nanostructured surfaces and organic/inorganic hybrids.- Thin films of organic semiconductors for OPV, OLEDs and OTFT.- Developments in ellipsometric real-time/in-situ monitoring techniques.- Infrared brillant light sources for micro-ellipsometric studies of organic films.- Collection of optical constants of organic layers.