" extremely well written easy-to-read description of the microscope conditions that best reveal the structure of the grain boundary and the methods used to analyze the images excellent style of writing makes it easy and enjoyable to read An important part is the detailed description of examples which will make it an invaluable aid to those starting in the field. For those in the field it provides an excellent account of the methods that have been used by the authors to identify the Burgers vector of interfacial dislocations provides a review of the work that has been done on understanding the properties of grain boundaries the authors' considerable contribution to the field."
-I.M. Robertson, Microscopy Research and Technique, 4, 10, 1993

" clearly written and abundantly illustrated "
-P.W. Hawkes, Ultramicroscopy, 50, 111, 1993

" a book one can recommend to anybody working on interface and grain boundary structures. A lot of the techniques mentioned not only hold for alloys but also for semiconductors and ceramics The work treated is very impressive, very well presented, and perfectly illustrated should be on the desk of any materials science electron microscopist working on alloys and dealing with dislocation and grain boundary problems. Any laboratory carrying out electron microscopy in materials science should have a copy "
-G. Van Tendeloo, Advanced Materials, 4, 10, 1994

Autorentext
C.T Forwood (CSIRO Manufacturing Science and Technology, Australia)

Klappentext
This particular book covers all aspects of the use of the transmission electron microscope in the study of grain boundaries and interphase interfaces in metals and alloys.

Zusammenfassung
Examines the structure of interfaces in metals and alloys using transmission electron microscopy. This book describes the methods used for identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs.

Inhalt
Dislocation theory of interfaces; Image formation and diffraction effects in the electron microscopy of interfaces; Determination of crystallographic and diffraction parameters; Low-angle grain boundaries; High- angle grain boundaries; Some properties of high-angle grain boundaries; Interphase interfaces.