This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

Offers a full color pedagogic approach to atomic force microscopy Presents the fundamentals of the technique in detail Discusses related technical aspects in depth

Autorentext

Prof. Dr. rer. nat. Bert Voigtländer studied Physics at the University of Cologne and the RWTH Aachen University, earning his Ph.D. in 1989. While a postdoctoral researcher at the IBM Research Center in Yorktown Heights, USA, he began his current field of research using scanning probe microscopy. As a staff scientist at the Jülich Research Centre (Forschungszentrum Jülich), his recent focus has been nanoscale charge transport measurements. In 2012, he founded the spin-off company mProbes, which offers multi-tip scanning probe microscopes. To date, he has authored and co-authored over 100 peer-reviewed publications.

Inhalt

Introduction.- Part I: Scanning Probe Microscopy Instrumentation.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe.- Part II: Atomic Force Microscopy (AFM).- Forces between Tip and Sample.- Technical Aspects of Atomic Force Microscopy.- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy.- Intermittent Contact Mode/Tapping Mode.- Mapping of Mechanical Properties Using Force-Distance.- Frequency Modulation (FM) Mode in Dynamic Atomic Force.- Noise in Atomic Force Microscopy.- Quartz Sensors in Atomic Force Microscopy.