This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span the subjects of multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements, surface atomic scale mechanical machineries. This state-of-the-art account brings academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.

Addresses for the first time multi-probes (multi-channels) atomically precise interconnections to an atom circuit or to a single molecule circuit Includes supplementary material: sn.pub/extras

Autorentext
Dr Christian Joachim is First Class Director of Research at the Centre National de la Recherche Scientifique (CNRS), Nanoscience group (GNS) at CEMES/CNRS Toulouse (www.cemes.fr/GNS/) and Adjunct Professor of Nanosciences and Quantum resources at ISAE. He coordinated the EU-sponsored projects: BUN ("Bottom-up Nanomachines") and Pico-Inside (www.picoinside.org) and directed 2 NATO Advanced Research Workshops on Nanoscale Sciences in the early 1990's. He is currently in charge of the French Midi-Pyrenees research effort in Nanoscience (CPER Campus G. Dupouy)" and of the new European Integrated Project AtMol (www.atmol.eu). He is also A*STAR VIP attached to IMRE to develop atomic scale technology in Singapore and WPI in charge of the Toulouse MANA satellite (MEXT Japan).

Inhalt
Multi-probe UHV machine instrumentation.- Nano-material nanowires charaterisation.- Surface conductance measurements.- Surface atomic scale machineries (transistor, logic gate, mechanics).- Industrial applications.