Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.

Inhalt
Joseph Naus: Father of the Scan Statistic.- Precedence-Type Tests for the Comparison of Treatments with a Control.- Extreme Value Results for Scan Statistics.- Boundary Crossing Probability Computationsin the Analysis of Scan Statistics.- Approximations for Two-Dimensional Variable Window Scan Statistics.- Applications of Spatial Scan Statistics: A Review.- Extensions of the Scan Statistic for the Detection and Inference of SpatialClusters.- 1-Dependent Stationary Sequences and Applications to Scan Statistics.- Scan Statistics in Genome-Wide Scan for Complex Trait Loci.- On Probabilities for Complex Switching Rules in Sampling Inspection.- Bayesian Network Scan Statistics for Multivariate Pattern Detection.- ULS Scan Statistic for Hotspot Detection with Continuous Gamma Response.- False Discovery Control for Scan Clustering.- Martingale Methods for Patterns and Scan Statistics.- How Can Pattern Statistics Be Useful for DNA Motif Discovery?.- Occurrence of Patterns and Motifs in Random Strings.- Detection of Disease Clustering.