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Yield and Reliability in Microwave Circuit and System Design

  • Livre Relié
  • 300 Nombre de pages
Texte du rabat This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statisti... Lire la suite
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Description

Texte du rabat

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

Contenu

Yield; calculating yield; statistical sensitivity; yield optimization; statistical modeling; case studies and examples.

Détails sur le produit

Titre: Yield and Reliability in Microwave Circuit and System Design
Auteur:
Selected by:
Code EAN: 9780890065273
ISBN: 978-0-89006-527-3
Format: Livre Relié
Editeur: Artech House Inc
Genre: Electrotechnique
nombre de pages: 300
Poids: 585g
Taille: H237mm x B159mm x T21mm
Année: 1993