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Characterization of the Field Emission Properties of Carbon Nanotube Films Formed on Silicon Carbide Substrates by Surface Decomposition

  • Couverture cartonnée
  • 182 Nombre de pages
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Texte du rabat Numerous works found in the literature report that carbon nanotubes have excellent field emission properties, emitt... Lire la suite
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Texte du rabat

Numerous works found in the literature report that carbon nanotubes have excellent field emission properties, emitting high electron current densities at low electric fields. Recent work by the Air Force Research Laboratory Materials and Manufacturing Directorate has shown that dense arrays of vertically aligned carbon nanotubes (CNTs) form on the surface of silicon carbide wafers during high temperature (1400 - 1700oC) anneals under moderate vacuum conditions (10-2 - 10-5 Torr). The novelty of this growth method is that the carbon nanotubes form without the aid of a metal catalyst, allowing for potentially defect free carbon nanotubes to form. In this thesis, carbon nanotube films were grown by the surface decomposition of silicon carbide substrates and the associated field emission characteristics were investigated to determine if films grown using this method possessed advantages over films grown using metal catalyzed methods.

Informations sur le produit

Titre: Characterization of the Field Emission Properties of Carbon Nanotube Films Formed on Silicon Carbide Substrates by Surface Decomposition
Auteur:
Code EAN: 9781288274284
ISBN: 1288274289
Format: Couverture cartonnée
nombre de pages: 182
Poids: g
Taille: H246mm x B189mm x T11mm
Année: 2012

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