Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

Klappentext

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

Inhalt
1 Introduction.- 1.1 Motivation.- 1.2 Conventional Analog Signal Generation.- 1.3 Digital Signal Generation.- 1.4 Design Constraints.- 2 An Oversampling-Based Analog Oscillator.- 2.1 Motivation.- 2.2 Background Theory.- 2.3 An Area-Efficient Oscillator Circuit.- 2.4 Simulation Results.- 2.5 Experimental Results.- 3 Analog Multi-Tone Signal Generation.- 3.1 Motivation.- 3.2 Addition of Delta-Sigma Modulated Signals.- 3.3 Multi-Tone Circuit Configurations.- 3.4 An Area-Efficient Multi-Tone Oscillator.- 3.5 Simulation Results.- 3.6 Experimental Results.- 4 An Oversampling-Based Function Generator.- 4.1 Motivation.- 4.2 Primary Building Blocks.- 4.3 An Area-Efficient Function Generator.- 4.4 Simulation Results.- 4.5 Experimental Results.- 5 Conclusion.- 5.1 Discussion of Results.- 5.2 Topics of Future Research.- A Delta-Sigma Modulation.- A.1 Principles of Single-Bit Delta-Sigma Modulation.- A.2 A Frequency Domain Perspective: Noise-Shaping.- B VHDL Description: Single-Tone Oscillator.- B.1 The Oscillator.- C Verilog Description: Single-Tone Oscillator.- C.1 The Oscillator.- C.2 Oscillator Test Routine.- D Hsipce Reconstruction Program.- D.1 CD2SP.C.- D.2 Sample HSPICE Input File.- References.