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Fringe 2005

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In 1989 the time was hot to create a workshop series dedicated to the dicussion of the latest results in the automatic processing ... Weiterlesen
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Beschreibung

In 1989 the time was hot to create a workshop series dedicated to the dicussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial applications of optical metrology. However, such a workshop must take place in a dynamic environment. The- fore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 new prin- ples of optical shape measurement, setup calibration, phase unwr- ping and nondestructive testing were the focus of discussion, while in 1997 new approaches in multi-sensor metrology, active measu- ment strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was dedicated to - tical methods for micromeasurements, hybrid measurement te- nologies and new sensor solutions for industrial inspection. The fifth workshop takes place in Stuttgart, the capital of the state of Baden- Württemberg and the centre of a region with a long and remarkable tradition in engineering. Thus after Berlin 1989, Bremen 1993, 1997 and 2001, Stuttgart is the third Fringe city where international - perts will meet each other to share new ideas and concepts in optical metrology. This volume contains the papers presented during FRINGE 2005.

Klappentext

The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields.

Topics of particular interest are:

Advanced Computer Aided Measurement Techniques;

Resolution Enhanced Technologies in Optical Metrology;

New approaches in Wide Scale 4D Optical Metrology;

Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems.

Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems.

 



Inhalt
Key Note.- Optical Measurement Techniques.- New Methods and Tools for Data Processing.- New Challenges for Optical Metrology: Evolution or Revolution.- Interpreting interferometric height measurements using the instrument transfer function.- Are Residues of Primary Importance in Phase Unwrapping?.- Experimental Study of Coherence Vortices: Birth and Evolution of Phase Singularities in the Spatial Coherence Function.- Properties of Isothetic Lines in Discontinuous Fields.- Heterodyne, quasi-heterodyne and after.- Robust three-dimensional phase unwrapping algorithm for phase contrast magnetic resonance velocity imaging.- Signal processing of interferogram using a two-dimensional discrete Hilbert transform.- Recent advances in automatic demodulation of single fringe patterns.- Comparison of Techniques for Fringe Pattern Background Evaluation.- Deformed surfaces in holographic Interferometry. Similar aspects concerning nonspherical gravitational fields.- Dynamic evaluation of fringe parameters by recurrence processing algorithms.- Fast hologram computation for holographic tweezers.- Wavelet analysis of speckle patterns with a temporal carrier.- Different preprocessing and wavelet transform based filtering techniques to improve Signal- to-noise ratio in DSPI fringes.- Wavefront Optimization using Piston Micro Mirror Arrays.- Adaptive Correction to the Speckle Correlation Fringes using twisted nematic LCD.- Random phase shift interferometer.- Spatial correlation function of the laser speckle field with holographic technique.- Fault detection from temporal unusualness in fringe patterns.- The Virtual Fringe Projection System (VFPS) and Neural Networks.- Fringe contrast enhancement using an interpolation technique.- Some remarks on accuracy of imaging polarimetry with carrier frequency.- Application of weighted smoothing splines to the local denoising of digital speckle pattern interferometry fringes.- Investigation of the fringe order in multi-component shearography surface strain measurement.- Metrological Fringe inpainting.- Combination of Digital Image Correlation Techniques and Spatial Phase Shifting Interferometry for 3D-Displacement Detection and Noise Reduction of Phase Difference Data.- Photoelastic tomography for birefringence determination in optical microelements.- Optimization of electronic speckle pattern interferometers.- Properties of phase shifting methods applied to time average interferometry of vibrating objects.- Depth-resolved displacement measurement using Tilt Scanning Speckle Interferometry.- New Phase Unwrapping Strategy for Rapid and Dense 3D Data Acquisition in Structured Light Approach.- Determination of modulation and background intensity by uncalibrated temporal phase stepping in a two-bucket spatially phase stepped speckle interferometer.- Resolution Enhanced Technologies.- EUVA's challenges toward 0.1nm accuracy in EUV at-wavelength interferometry.- Some similarities and dissimilarities of imaging simulation for optical microscopy and lithography.- A Ronchi-Shearing Interferometer for compaction test at a wavelength of 193nm.- Simulation and error budget for high precision interferometry.- Progress on the wide scale Nano-positioning and Nanomeasuring Machine by Integration of Optical-Nanoprobes.- Through-Focus Point-Spread Function Evaluation for Lens Metrology using the Extended Nijboer-Zernike Theory.- Digital Holographic Microscopy (DHM) applied to Optical Metrology: A resolution enhanced imaging technology applied to inspection of microscopic devices with subwavelength resolution.- An adaptive holographic interferometer for high precision measurements.- Spatio-Temporal Joint Transform Correlator and Fourier Domain OCT.- Subdivision of Nonlinearity in Heterodyne Interferometers.- Wide Scale 4D Optical Metrology.- Progress in SAR Interferometry.- New calibration procedure for measuring shape on specular surfaces.- Fringe Reflection for high resolution topometry and surface description on variable lateral scales.- Full-Field Shape Measurement of Specular Surfaces.- Numerical Integration of Sampled Data for Shape Measurements: Metrological Specification.- Fringe analysis in scanning frequency interferometry for absolute distance measurement.- Surface Shape Measurement by Dual-wavelength Phase-shifting Digital Holography.- Phase-shifting interferometric profilometry with a wide tunable laser source.- Opto-Mechatronic System for Sub-Micro Shape Inspection of Innovative Optical Components for Example of Head-Up-Displays.- 3-D profilometry with acousto-optic fringe interferometry.- Phase-shifting shearing interferometry with a variable polarization grating recorded on Bacteriorhodopsin.- Quasi-absolute testing of aspherics using Combined Diffractive Optical Elements.- Selfcalibrating fringe projection setups for industrial use.- 3-D shape measurement method using point-array encoding.- 3D measurement of human face by stereophotogrammetry.- Fast 3D shape measurement system based on co...

Produktinformationen

Titel: Fringe 2005
Untertitel: The 5th International Workshop on Automatic Processing of Finge Patterns
EAN: 9783540293033
ISBN: 978-3-540-29303-3
Digitaler Kopierschutz: Wasserzeichen
Format: E-Book (pdf)
Herausgeber: Springer
Genre: Technik
Anzahl Seiten: 706
Veröffentlichung: 26.01.2006
Jahr: 2006
Untertitel: Englisch
Dateigrösse: 17.8 MB