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Physical Analytics in Materials Science

  • Kartonierter Einband
  • 184 Seiten
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Nowadays the application of physical analytic methods in the materials science (synthesis, characterisation and development of new... Weiterlesen
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Beschreibung

Nowadays the application of physical analytic methods in the materials science (synthesis, characterisation and development of new materials) is essential. In this work four of these techniques, which are able to investigate surfaces and interfaces as well as the bulk material: secondary ion mass spectrometry (SIMS), Rutherford backscattering (RBS), electron microscopy (SEM, TEM) and Auger electron spectroscopy (AES) are applied on four different research areas: powder metallurgy, Tribology on the aerospace bearing materials, Gettering effects and defect engineering in Si and SiGe heterostructures. Generally, the use of the physical analytic methods in materials science is essential. Here, it could be shown that due to their figures of merit, SIMS, AES, RBS and SEM / TEM are complementary methods each one with advantages but also with some drawbacks.

Autorentext
Dragan Krecar, Dr. techn.: Study of technical chemistry at theUniversity of Technology in Vienna with analytic chemistry asmain focus. Doctorate with main focus in physical analytics in 2006

Produktinformationen

Titel: Physical Analytics in Materials Science
Untertitel: Applications of High Performance Physical Analytics (SIMS, RBS, SEM/TEM and AES) in Materials Science
Autor:
EAN: 9783838108919
ISBN: 978-3-8381-0891-9
Format: Kartonierter Einband
Herausgeber: Südwestdeutscher Verlag für Hochschulschriften AG
Genre: Sonstiges
Anzahl Seiten: 184
Gewicht: 290g
Größe: H220mm x B150mm x T11mm
Jahr: 2015